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Forventes på lager: 08-06-1999
Details minor, trace and ultratrace methods. This book addresses the stages that precede measurement. It highlights the measurement systems likely to be used by the pragmatic analyst. It provides maps and signposts for metals analysts who must verify that stringent trace level compositional specifications have been met.
| Forlag | Taylor & Francis Inc |
| Forfatter | Thomas R. (Carpenter Technology Corporation Dulski |
| Type | Bog |
| Format | Hardback |
| Sprog | Engelsk |
| Udgivelsesdato | 08-06-1999 |
| Første udgivelsesår | 1999 |
| Originalsprog | United States |
| Sideantal | 590 |
| Indbinding | Hardback |
| Forlag | Taylor & Francis Inc |
| Sideoplysninger | 590 pages |
| Mål | 237 x 157 x 36 |
| ISBN-13 / EAN-13 | 9780824719852 |