Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions
(Bog, Paperback / softback, Engelsk)
Forlag:
Taylor & Francis Ltd
- Type: Bog
- Format: Paperback / softback
-
Sprog:
Engelsk
- ISBN-13: 9781032375113
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Beskrivelse
The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. Major instruments covered include X-Ray Diffraction, NSOM Raman, X-Ray Photo Spectroscopy, UV-VIS- NIR Spectrosphotometer, FTIR Spectroscopy, and so forth.
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| Forlag | Taylor & Francis Ltd |
| Forfattere | Ch Sateesh (University of Johannesburg Kumar, M. Muralidhar (Madanapalle Institute of Technology & Science Singh, Ram (NIT Jamshedpur Krishna |
| Type | Bog |
| Format | Paperback / softback |
| Sprog | Engelsk |
| Udgivelsesdato | 29-11-2024 |
| Første udgivelsesår | 2024 |
| Serie | Advanced Materials Processing and Manufacturing |
| Illustrationer | 52 Line drawings, black and white; 5 Halftones, black and white; 57 Illustrations, black and white |
| Originalsprog | United Kingdom |
| Sideantal | 130 |
| Indbinding | Paperback / softback |
| Forlag | Taylor & Francis Ltd |
| Sideoplysninger | 130 pages, 52 Line drawings, black and white; 5 Halftones, black and white; 57 Illustrations, black |
| Mål | 156 x 234 x 11 |
| ISBN-13 / EAN-13 | 9781032375113 |