Electron Microscopy and Analysis

(Bog, Paperback / softback, Engelsk)
Forfattere: Peter J. (University of Liverpool Goodhew, John (The University of Manchester Humphreys, Richard (GEC-Marconi Materials Technology Beanland

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Beskrivelse

A guide to scanning and transmission microscopes and to the analytical techniques based on them. It covers the techniques of electron energy loss spectroscopy and energy dispersive X-ray analysis. It compares electron microscopic techniques to many of the competing physical investigative techniques available.

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Alle detaljer

Forlag Taylor & Francis Ltd
Forfattere Peter J. (University of Liverpool Goodhew, John (The University of Manchester Humphreys, Richard (GEC-Marconi Materials Technology Beanland
Type Bog
Format Paperback / softback
Sprog Engelsk
Udgave 3 ed
Udgivelsesdato 30-11-2000
Første udgivelsesår 2000
Illustrationer 147 Illustrations, color
Originalsprog United Kingdom
Sideantal 264
Indbinding Paperback / softback
Forlag Taylor & Francis Ltd
Sideoplysninger 264 pages, 147 Illustrations, color
Mål 157 x 236 x 16
ISBN-13 / EAN-13 9780748409686