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Forventes på lager: 07-07-2017
A guide to scanning and transmission microscopes and to the analytical techniques based on them. It covers the techniques of electron energy loss spectroscopy and energy dispersive X-ray analysis. It compares electron microscopic techniques to many of the competing physical investigative techniques available.
| Forlag | Taylor & Francis Ltd |
| Forfatter | Peter J. Goodhew |
| Type | Bog |
| Format | Hardback |
| Sprog | Engelsk |
| Udgave | 3 ed |
| Udgivelsesdato | 07-07-2017 |
| Første udgivelsesår | 2017 |
| Originalsprog | United Kingdom |
| Sideantal | 264 |
| Indbinding | Hardback |
| Forlag | Taylor & Francis Ltd |
| Sideoplysninger | 264 pages |
| Mål | 234 x 156 |
| ISBN-13 / EAN-13 | 9781138441538 |