V. Cherepin Forfatter

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  1.595,- kr

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  Secondary Ion Mass Spectroscopy of Solid Surfaces (Bog, Hardback, Engelsk)

  Af: V. Cherepin

  This volume is devoted to the physics, instrumentation and analytical methods of secondary ion mass spectroscopy (SIMS) in relation to solid surfaces

  PRIS

  1.595,- kr

  FRAGTFRI LEVERING

  Levering: Skaffevare (forvent 14 - 30 hverdage)

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