Influence of Temperature on Microelectronics and System Reliability: A Physics of Fai... (Bog, Paperback / softback, Engelsk)
  1. Forside
  2. Bøger
  3. Engelske bøger
  4. Elektroteknik
  5. Elektronik teknik
  6. Influence of Temperature on Microelectronics and System...

Influence of Temperature on Microelectronics and System Reliability: A Physics of Failure Approach

(Bog, Paperback / softback, Engelsk)
Forfattere: Pradeep (Auburn University Lall, Michael (University of Maryland Pecht, Edward B. Hakim
Influence of Temperature on Microelectronics and System Reliability: A Physics of Failure Approach
Forlag: Taylor & Francis Ltd

Bemærk: Kan ikke leveres før jul.

Når du handler på WilliamDam.dk, betaler du den pris du ser.

  • Ingen gebyrer
  • Ingen abonnementer
  • Ingen bindingsperioder

Relaterede kategorier

Elektronik teknik Elektroteknik
  = Emner / kategorier
  = Sektioner / guides
  = Specialsider
  = Kampagner

Beskrivelse

This book raises the level of understanding of thermal design criteria. It provides the design team with sufficient knowledge to help them evaluate device architecture trade-offs and the effects of operating temperatures.

Læsernes anmeldelser (0)

Alle detaljer

Forlag Taylor & Francis Ltd
Forfattere Pradeep (Auburn University Lall, Michael (University of Maryland Pecht, Edward B. Hakim
Type Bog
Format Paperback / softback
Sprog Engelsk
Udgivelsesdato 19-06-2019
Første udgivelsesår 2019
Originalsprog United Kingdom
Sideantal 336
Indbinding Paperback / softback
Forlag Taylor & Francis Ltd
Sideoplysninger 336 pages
Mål 254 x 178
ISBN-13 / EAN-13 9780367400972