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Forventes på lager: 30-06-2021
Based on 3D process and device simulations with mechanical stress simulations by finite element techniques, this book explains performance assessment of nanoscale devices with strained SiGe and other stressors. It explains the process-induced stress transfer and developments at 7nm technology and below node in the area of strain-engineered devices.
| Forlag | Taylor & Francis Ltd |
| Forfatter | Chinmay K. (SOA University Bhubaneswar Maiti |
| Type | Bog |
| Format | Hardback |
| Sprog | Engelsk |
| Udgivelsesdato | 30-06-2021 |
| Første udgivelsesår | 2021 |
| Illustrationer | 23 Tables, black and white; 136 Line drawings, black and white; 3 Halftones, black and white; 139 Illustrations, black and white |
| Originalsprog | United Kingdom |
| Sideantal | 260 |
| Indbinding | Hardback |
| Forlag | Taylor & Francis Ltd |
| Sideoplysninger | 260 pages, 23 Tables, black and white; 136 Line drawings, black and white; 3 Halftones, black and wh |
| Mål | 161 x 241 x 22 |
| ISBN-13 / EAN-13 | 9780367519292 |