Bøger af George W. Zobrist

George W. Zobrist Forfatter

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  • PRIS
    759,- kr
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    This text explores VLSI fault modelling and testing techniques and covers such topics as: physical fault modelling and simulation for VSLI MOS circuits; designing CMOS gates to test open faults; testing bridging faults in VLSI; and testable design synthesis models.

    PRIS
    759,- kr
    Levering: Print on Demand (forvent 14 - 30 hverdage)
Viser 1 - 1 af 1 resultat