Pradeep (Auburn University Lall Forfatter

Visning: Type : Alle | Sprog : Alle | Format : Alle

• 

  PRIS

  2.086,- kr

  FRAGTFRI LEVERING

  Levering: Skaffevare (forvent 14 - 30 hverdage)

  Bemærk: Kan ikke leveres før jul.

  Influence of Temperature on Microelectronics and System Reliability: A Physics of Failure Approach (Bog, Hardback, Engelsk)

  Af: Pradeep (Auburn University Lall

  This book provides a sound scientific basis for achieving system operation without reliability penalties at realistic steady state temperatures. guidelines for thermal derating of microelectronic devices.

  PRIS

  2.086,- kr

  FRAGTFRI LEVERING

  Levering: Skaffevare (forvent 14 - 30 hverdage)

  Læg i kurv
• 

  PRIS

  736,- kr

  FRAGT FRA 39,-

  Levering: Skaffevare (forvent 14 - 30 hverdage)

  Bemærk: Kan ikke leveres før jul.

  Influence of Temperature on Microelectronics and System Reliability: A Physics of Failure Approach (Bog, Paperback / softback, Engelsk)

  Af: Pradeep (Auburn University Lall

  This book raises the level of understanding of thermal design criteria. It provides the design team with sufficient knowledge to help them evaluate device architecture trade-offs and the effects of operating temperatures.

  PRIS

  736,- kr

  FRAGT FRA 39,-

  Levering: Skaffevare (forvent 14 - 30 hverdage)

  Læg i kurv