R.F. Egerton Forfatter

Visning: Type : Bog | Sprog : Alle | Format : Alle Der vises kun bøger

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  PRIS

  3.296,- kr

  FRAGTFRI LEVERING

  Levering: Skaffevare (forvent 14 - 30 hverdage)

  Bemærk: Kan ikke leveres før jul.

  Electron Energy-Loss Spectroscopy in the Electron Microscope (Bog, Paperback / softback, Engelsk)

  Af: R.F. Egerton

  Within the last 30 years, electron energy-loss spectroscopy (EELS) has become a standard analytical technique used in the transmission electron microscope to extract chemical and structural information down to the atomic level.

  PRIS

  3.296,- kr

  FRAGTFRI LEVERING

  Levering: Skaffevare (forvent 14 - 30 hverdage)

  Læg i kurv
• 

  PRIS

  3.296,- kr

  FRAGTFRI LEVERING

  Levering: Skaffevare (forvent 14 - 30 hverdage)

  Bemærk: Kan ikke leveres før jul.

  Electron Energy-Loss Spectroscopy in the Electron Microscope (Bog, Hardback, Engelsk)

  Af: R.F. Egerton

  Within the last 30 years, electron energy-loss spectroscopy (EELS) has become a standard analytical technique used in the transmission electron microscope to extract chemical and structural information down to the atomic level.

  PRIS

  3.296,- kr

  FRAGTFRI LEVERING

  Levering: Skaffevare (forvent 14 - 30 hverdage)

  Læg i kurv
• 

  PRIS

  590,- kr

  FRAGT FRA 39,-

  Levering: Skaffevare (forvent 14 - 30 hverdage)

  Bemærk: Kan ikke leveres før jul.

  Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM (Bog, Paperback / softback, Engelsk)

  Af: R.F. Egerton

  Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences.

  PRIS

  590,- kr

  FRAGT FRA 39,-

  Levering: Skaffevare (forvent 14 - 30 hverdage)

  Læg i kurv