Sebastian Huhn Forfatter

Visning: Type : Alle | Sprog : Alle | Format : Paperback / softback

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  Design for Testability, Debug and Reliability: Next Generation Measures Using Formal Techniques (Bog, Paperback / softback, Engelsk)

  Af: Sebastian Huhn

  This book introduces several novel approaches to pave the way for the next generation of integrated circuits, which can be successfully and reliably integrated, even in safety-critical applications.

  PRIS

  1.074,- kr

  FRAGTFRI LEVERING

  Levering: Skaffevare (forvent 14 - 30 hverdage)

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