Sebastian Huhn Forfatter
Visning: Type : Alle | Sprog : Engelsk | Format : Paperback / softback Der vises kun varer på engelsk
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Design for Testability, Debug and Reliability: Next Generation Measures Using Formal Techniques (Bog, Paperback / softback, Engelsk)
This book introduces several novel approaches to pave the way for the next generation of integrated circuits, which can be successfully and reliably integrated, even in safety-critical applications.
Levering: Skaffevare (forvent 14 - 30 hverdage)
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