Ireneusz Mrozek Forfatter

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• 

  PRIS

  483,- kr

  FRAGT FRA 39,-

  Levering: Skaffevare (forvent 14 - 30 hverdage)

  Bemærk: Kan ikke leveres før jul.

  Multi-run Memory Tests for Pattern Sensitive Faults (Bog, Hardback, Engelsk)

  Af: Ireneusz Mrozek

  This book describes efficient techniques for production testing as well as for periodic maintenance testing (specifically in terms of multi-cell faults) in modern semiconductor memory.

  PRIS

  483,- kr

  FRAGT FRA 39,-

  Levering: Skaffevare (forvent 14 - 30 hverdage)

  Læg i kurv
• 

  PRIS

  483,- kr

  FRAGT FRA 39,-

  Levering: Skaffevare (forvent 14 - 30 hverdage)

  Bemærk: Kan ikke leveres før jul.

  Multi-run Memory Tests for Pattern Sensitive Faults (Bog, Paperback / softback, Engelsk)

  Af: Ireneusz Mrozek

  This book describes efficient techniques for production testing as well as for periodic maintenance testing (specifically in terms of multi-cell faults) in modern semiconductor memory.

  PRIS

  483,- kr

  FRAGT FRA 39,-

  Levering: Skaffevare (forvent 14 - 30 hverdage)

  Læg i kurv